Junction Parameters

Josephson Junction Parameters: Junction electrical and physical parameters extracted

from or used as inputs to EPR analysis

  1. Junction Electrical Parameters

Parameter

Symbol

Unit

Description

Optimal / Best Value

Good Range

Acceptable Range

Poor / Worst Value

Physical Significance

Josephson Inductance

L_J

nH

Linear (small-signal) inductance of Josephson junction; L_J = Φ₀ / (2π

I_c). Central EPR input.

5 – 20 nH

2 – 50 nH

50 – 200 nH

> 500 nH

Sets qubit frequency via ω_q = 1 / √(L_J * C_S); too large → very low

frequency, thermally excited.

Critical Current

I_c

µA

Maximum supercurrent through junction; I_c = Φ₀ / (2π L_J). Sets EJ =

I_c·Φ₀ / (2π).

20 – 80 nA (transmon)

5 – 200 nA

200 nA – 2 µA

> 10 µA

Too high → small L_J → high frequency; too low → large L_J, strong flux

noise sensitivity.

Critical Current Density

J_c

A/m²

Critical current per junction area; set by AlOx barrier thickness during

deposition.

100 – 500 A/m²

50 – 1000 A/m²

1000 – 5000 A/m²

> 10⁴ A/m²

Reproducibility of J_c determines frequency spread; EPR sensitivity

analysis relates Jc to ω_q.

Junction Capacitance

C_J

fF

Self-capacitance of the junction; contributes to total qubit capacitance

C_S.

2 – 10 fF

1 – 20 fF

20 – 100 fF

> 200 fF

Large C_J reduces charging energy EC, lowering anharmonicity; EPR

partitions C_J from shunt.

Junction Area

A_J

µm²

Physical overlap area of the junction; A_J = I_c/J_c. Fabrication

controlled.

0.01 – 0.1 µm²

0.005 – 0.5 µm²

0.5 – 2 µm²

> 5 µm²

Larger area → larger C_J and lower EC; smaller area → harder

fabrication, larger variation.

Josephson Energy

E_J / h

GHz

Josephson energy EJ = I_c·Φ₀ / (2π); governs tunneling energy.

10 – 50 GHz

5 – 100 GHz

100 – 500 GHz

> 1 THz

With EC, determines qubit spectrum; EJ/EC > 50 for transmon regime.

Charging Energy

E_C / h

MHz

Charging energy EC = e²/(2C_S); determines anharmonicity and charge

sensitivity.

150 – 350 MHz

100 – 500 MHz

500 MHz – 1 GHz

> 2 GHz

EC ~ anharmonicity for transmon; high EC → charge qubit regime, high

noise sensitivity.

  1. Junction Loss & Quality

Parameter

Symbol

Unit

Description

Optimal / Best Value

Good Range

Acceptable Range

Poor / Worst Value

Physical Significance

Junction Loss Tangent

tan delta_J

dimensionless

Intrinsic dielectric loss of AlOx tunnel barrier; limits junction Q and

T_1.

< 3×10⁻⁶

< 1×10⁻⁵

1×10⁻⁵ – 1×10⁻⁴

> 1×10⁻³

TLS in AlOx barrier is historically the primary T_1 limit; improved by

ALD or crystalline barriers.

Junction Subgap Resistance

R_sg

Subgap resistance of junction; represents quasiparticle leakage channel.

> 100 GΩ

10 – 100 GΩ

1 – 10 GΩ

< 100 MΩ

Low R_sg indicates excess quasiparticle density; limits T_1 via

quasiparticle poisoning.

Flux Noise Spectral Density

S_Φ(1Hz)

µΦ₀²/Hz

Amplitude of 1/f flux noise at 1 Hz; governs dephasing for

flux-sensitive qubits.

< 1 µΦ₀²/Hz

1 – 5 µΦ₀²/Hz

5 – 20 µΦ₀²/Hz

> 50 µΦ₀²/Hz

Arises from surface spin fluctuators; EPR current participation at

surfaces informs sensitivity.

Charge Noise Spectral Density

S_q(1Hz)

e²/Hz

Amplitude of 1/f charge noise; relevant for charge-sensitive qubits.

< 10⁻⁷ e²/Hz

< 10⁻⁶ e²/Hz

10⁻⁶ – 10⁻⁵ e²/Hz

> 10⁻⁴ e²/Hz

Exponentially suppressed in transmon regime; relevant for qubits with

EJ/EC < 20.