Qubit Performance

Qubit Performance Metrics: Coherence times, gate fidelities, and spectral properties

derived from EPR loss analysis

  1. Coherence Times

Parameter

Symbol

Unit

Description

Optimal / Best Value

Good Range

Acceptable Range

Poor / Worst Value

Physical Significance

Energy Relaxation Time T_1

T_1

µs

Time for qubit to decay from |1⟩ to |0⟩; bounded by all loss channels

weighted by EPR participation.

> 500 µs

100 – 500 µs

10 – 99 µs

< 1 µs

T_1 is the hard ceiling on gate fidelity; EPR identifies dominant loss

channel for improvement.

Pure Dephasing Time T_f

T_f

µs

Dephasing time due to low-frequency noise (flux, charge, 1/f); not

directly from EPR but informed by participation.

> 200 µs

50 – 200 µs

10 – 49 µs

< 5 µs

Limits T2; EPR participation at surfaces informs TLS dephasing

contribution.

Coherence Time T2 (Ramsey)

T2*

µs

Total dephasing time including low-frequency noise; T2* = 2T1.

> 300 µs

100 – 300 µs

20 – 99 µs

< 10 µs

Practical coherence limit; T2*/2T1 ≈ 1 indicates pure-dephasing free

regime.

Coherence Time T2 (Echo)

T_2^E

µs

Echo coherence time; removes low-frequency noise contributions; T_2^E =

2T1.

> 500 µs

200 – 500 µs

50 – 199 µs

< 20 µs

Ratio T_2^E/T2* quantifies 1/f noise power; EPR participations guide

substrate/surface optimization.

Quality Factor Q_qubit

Q_q

dimensionless

Qubit quality factor Q = ω_q·T_1; dimensionless figure of merit across

frequencies.

> 10⁷

10⁶ – 10⁷

10⁵ – 10⁶

< 10⁴

Universal metric independent of frequency; Q > 10⁷ represents

state-of-the-art performance.

  1. Gate Performance

Parameter

Symbol

Unit

Description

Optimal / Best Value

Good Range

Acceptable Range

Poor / Worst Value

Physical Significance

Single-Qubit Gate Fidelity

F_1Q

%

Average fidelity of single-qubit Clifford gates; limited by T_1, T2,

leakage (anharmonicity).

> 99.9%

99.5 – 99.9%

99.0 – 99.4%

< 98%

< 99.9% limits surface-code error correction threshold; leakage tied

to anharmonicity from EPR.

Two-Qubit Gate Fidelity

F_2Q

%

Average fidelity of two-qubit entangling gates (CZ, iSWAP); limited by

ZZ, T_1, T2.

> 99.5%

99.0 – 99.5%

97.0 – 98.9%

< 95%

ZZ coupling (cross-Kerr from EPR) is primary source of two-qubit gate

error on fixed-frequency chips.

Leakage Rate

L_1

% per gate

Probability of leaking to non-computational |2⟩ state per gate

operation.

< 0.01%

< 0.1%

0.1 – 0.5%

> 1.0%

Leakage non-destructively accumulates; requires active reset. Minimized

by maximising anharmonicity.

Readout Fidelity

F_RO

%

Assignment fidelity for single-shot qubit state discrimination.

> 99%

97 – 99%

90 – 96%

< 85%

Limited by chi (must be large), T_1 during readout, photon number. chi

extracted directly via EPR.

  1. Spectral Properties

Parameter

Symbol

Unit

Description

Optimal / Best Value

Good Range

Acceptable Range

Poor / Worst Value

Physical Significance

Charge Dispersion

varepsilon_q

MHz

Sensitivity of qubit frequency to offset charge; exponentially

suppressed in transmon regime.

< 0.01 MHz

< 0.1 MHz

0.1 – 1 MHz

> 5 MHz

Large dispersion → charge noise dephasing. EPR ratio EJ/EC must be >

50 for transmon.

E_J / E_C Ratio

E_J / E_C

dimensionless

Josephson to charging energy ratio; governs charge noise sensitivity vs.

anharmonicity trade-off.

50 – 100

40 – 120

20 – 39

< 10

< 20: charge qubit regime with high sensitivity; > 150:

anharmonicity too small for fast gates.

Flux Sensitivity (tunable qubits)

domega / dPhi

GHz/F0

Sensitivity of qubit frequency to external flux; relevant for

flux-tunable transmons and SQUID qubits.

< 0.1 GHz/F0 at sweet spot

< 0.5 GHz/F0

0.5 – 2 GHz/F0

> 5 GHz/F0

High flux sensitivity amplifies flux noise dephasing; biasing at sweet

spot minimizes first-order sensitivity.

Frequency Spread (fabrication)

sigma_omega / 2pi

MHz

Standard deviation of qubit frequencies across a chip due to junction

fabrication variation.

< 5 MHz

< 20 MHz

20 – 50 MHz

> 100 MHz

Large spread causes frequency collisions; EPR helps identify geometry

sensitivities to dimension variation.